Test & Measurement

Multitest’s Mercury Contactors for Wafer-Level Test Successfully Deployed to Subcontractors in Asia

10th March 2011
ES Admin
0
Multitest is pleased to announce that another major fabless semiconductor manufacturer has evaluated and approved its Mercury-based wafer-level contactors.
These Mercury contactors have eight sites and over 25 spring probes per site.

The contactors passed all qualification tests in the U. S. and have now been deployed to multiple testing subcontractors in Taiwan and Singapore. Based on this successful evaluation, the manufacturer has awarded Multitest with two additional WLCSP projects. Several of the Asian subcontractors have experience with the Mercury technology and are pleased with the long life, low maintenance requirements and low replacement probe price that the Mercury contactors provide.

The Mercury success story includes thousands of contactors for singulated devices, strip test and wafer-level test. The popularity of Mercury is due to the superior mechanical and electrical performance that results from its unique architecture and manufacturing process.
To quantify the performance, the probes have a bandwidth of approximately 20 GHz, a current-carrying capacity of over 2 Amps, an inductance of approximately 1 nH and a life of over one million insertions at wafer-level (values are pitch dependent).

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