/> The semiconductor test cell is a complicated environment that creates challenges for the transmission of electrical signals. The resources necessary to power and verify device functionality require large handling and testing equipment. Signals from the test equipment must travel long distances and through a variety of interfaces to reach the device. Slow speed signals with minimal loading can be sourced from a distance, but high speeds and high power must be supported near the device. This requires an intelligently designed interface that pays close attention to signal and power integrity.

The comprehensive SI/PI workshop focused specifically on ATE will present an introduction to power integrity, including critical concepts such as equivalent series inductance and PDS impedance. These concepts then will be applied to the semiconductor test cell environment, providing insight to when power integrity must be considered and how the test interface can be optimized to meet device requirements.