Memory tester features powerful MRA capability

30th June 2017

Alice Matthews

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Optimised for wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices, Advantest has launched the T5822 memory tester, the newest member of its T5800 product series. With mobile applications booming, semiconductor manufacturers need low-cost solutions for high-volume testing of a wide range of price-sensitive memory ICs.

The T5822 is designed to provide manufacturers of multiple memory devices with cost efficiency and optimal functionality, including full test coverage of as many as 1,536 devices in parallel with data transfer rates up to 1.2 gigabits per second (Gbps).

The new tester offers high-voltage resources such a level driver and DC testing capability along with an economical compact test head. It also features a powerful memory repair analysis (MRA) capability to help customers maximise their yields.

Using Advantest’s FutureSuite operating system, the system is compatible with test programmes for a range of memory devices. With output voltages from -10 to 13V, it provides the flexibility and economic performance to handle low-pin-count to high-pin-count devices.

In addition, the T5822 has the same modular architecture as its predecessors, providing users with a seamless transition from any other T5800 series tester.

“The T5822 is an optimal mixed-memory test solution, enhancing customers’ ROI while also reducing risk,” said Masuhiro Yamada, Executive Officer at Advantest.