Measurement software for Semiconductor Characterization System

23rd November 2006

ES Admin

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Keithley Instruments has announced the release of KTE Interactive V6.1, an updated version of its powerful KTEI (Keithley Test Environment Interactive) measurement software for its Model 4200-SCS Semiconductor Characterization System. The new KTEI 6.1 software enhances the pulse I-V capabilities of Keithley's Model 4200-PIV and significantly improves pulse and DC measurement correlation.

Pulse testing is becoming an increasingly important new characterization technique. The high-speed pulses eliminate potential damage from self-heating effects and are used to characterize new semiconductor materials and devices in applications such as charge trapping for high-k
gate stack characterization. Keithley's Model 4200-PIV package extends the capabilities of the Model 4200-SCS to include pulse generation and analysis for material and device characterization.

Additionally, KTEI V6.1 features new integrated drivers for Keithley Series 3400 Pulse Generators. These drivers allow the Keithley Model 4200-SCS to seamlessly integrate the Series 3400 Pulse Generators into the test environment to perform a variety of pulse functions. KTEI V6.1 is an easy,
field-installable software upgrade.

This latest release of KTEI software demonstrates Keithley's commitment to the continuous enhancement of its powerful measurement tools and to offering strong upgrade and migration paths for little cost, a benefit not universally available from all companies in the test industry. Continuous
enhancement allows Keithley to focus heavily on capital investment protection, allowing customers to simply upgrade software or hardware as needed rather than buying completely new hardware setups every few years.