LTE demonstration with a Samsung device at MWC

Anritsu Corporation announced its demonstration with the Samsung Electronics LTE USB Modem at Barcelona Mobile World Congress (MWC) from the 15th to 18th February 2010.

LTE is the next-generation, high-speed, mobile wireless technology planned for rollout from 2010 by the world’s leading operators. Anritsu has been working with Samsung Electronics, as a primary test vendor, to help prove its LTE capable devices.

Anritsu and Samsung Electronics have been jointly testing Samsung’s world-leading LTE device. Together they have already achieved excellent results, such as demonstrating 100 Mbps (downlink) and 50 Mbps (uplink) data throughput, and obtaining R&TTE validation, Europe’s radio regulatory requirement, using Anritsu’s LTE radio frequency conformance test system.

At the MWC Anritsu will be demonstrating its LTE solutions, including the MT8820C Radio Communication Analyzer, a next generation One Box Tester, and TS36.521 RF conformance tests with the ME7873L LTE radio frequency conformance test system using Samsung’s LTE devices.

LTE Exhibits

* MD8430A LTE Signaling Tester (e-NodeB Simulator)
* RTD Rapid Test Designer (test script editing and execution software)
* ME7832L LTE Protocol Conformance Test System
* ME7873L LTE RF Conformance Test System
* MT8820C Radio Communication Analyzer
* MS2830A Signal Analyzer