MOI supports USB 2.0 connector, cable assembly test

13th October 2014

Keysight Technologies (formerly Agilent)

Mick Elliott

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Datasheet

Keysight Technologies has published its Method of Implmentation (MOI) document for USB 2.0 connector and cable assembly compliance testing using the ENA Series network analyser’s enhanced time domain analysis option (E5071C-TDR). Developed in the mid-1990s, the USB standard features a number of variants including SuperSpeed USB, also known as USB 3.0, which supports a 5 Gbps transfer rate and offers up to a 10 times performance increase over its predecessor USB 2.0 (Hi-Speed USB).

While USB 3.0 has been widely adopted, USB 2.0 remains popular for car navigation systems and other applications where a 480 Mbps or less transfer rate is just enough.

Here, cable assemblies are considered captive if they are provided with a vendor-specific connect means (hardwired or custom detachable) to the peripheral. To ensure all such connectors and cable assemblies comply with the USB 2.0 standard, they must be tested in accordance with the specification.

While Keysight already offers a MOI for USB 3.0 connector and cable assembly compliance tests, support for USB 2.0 has now been added to the mix. The result is a complete USB solution that provides engineers with a measurement guide of procedures that supports compliance testing to both the USB 2.0 and 3.0 standards.

Using the MOI, state files and calibration kit files, cable and connector manufacturers and product integrators can now more efficiently perform compliance tests to the USB standard with the E5071C-TDR.