RF power amp reference solution includes envelop tracking

The Reference Solution is optimised for high throughput and highly accurate measurement quality. It is the only small footprint, full characterisation solution for design validation and product test of the RF power amplifier, as well as all of the passive devices surrounding the power amplifier, such as filters and duplexers.

The robust digital pre-distortion (DPD) algorithms in the Reference Solution are built on years of close cooperation with wireless manufacturing customers and insights gained from Keysight’s SystemVue simulation and N7614B Signal Studio for Power Amplifier Test software applications. This makes it the only solution capable of providing consistent measurements, from simulation to manufacturing, for next-generation power amplifier modules.

The proven DPD algorithms, with lookup table (LUT) and memory polynomial capability, complement the solution’s envelope tracking (ET) test capability. The solution includes fast waveform download, tight synchronisation and automated calibration, critical for ET test. The Reference Solution supports multiple vendors, such as the Signadyne SD AOU-H3353 single-slot, high-speed PXIe AWG and enables the fastest envelope generation in the industry while reducing the test footprint.

The new M937xA PXIe vector network analyser and the M9393A PXIe performance VSA, enable the full characterization that customers need, including key high-density, high-speed S-parameter measurements and high-speed harmonics distortion testing up to 27 GHz.