Wireless test set extended to meet new LTE-A challenges

21st January 2015

Keysight Technologies (formerly Agilent)

Mick Elliott

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Datasheet

Keysight Technologies has expanded the capabilities of its E7515A UXM wireless test set. The new features address the rapidly evolving 3GPP LTE-Advanced carrier aggregation advancements. The UXM wireless test set is a highly integrated signalling test set created for functional and RF design validation in the 4G era and beyond.

The UXM supports multiple cells, downlink and uplink carrier aggregation, MIMO up to 4x2 and integrated fading – allowing users to assess design readiness with greater confidence.

The new update gives chipset and UE designers the ability to validate 450 Mbps downlink end-to-end IP data throughput (by aggregating three 20 MHz component carriers) allowing mobile operators to use limited bandwidth resources for increased end-user download speeds. I will also allow verification of 100 Mbps uplink data rates via 2CC uplink carrier aggregation for both FDD and TDD, as well as intra-band measurement results using the industry-proven X-Series measurement applications.

There are features for many UE test applications, including RF, data throughput, mobility, battery drain, functional and OTA

Further enhancements for device validation, such as eICIC, 64QAM uplink modulation and multi-cell mobility have been included.

“This new update adds the cutting-edge capabilities customers will need to address the latest, and evolving, wireless device validation and test requirements,” said Joe DePond, general manager of Keysight's Mobile Broadband Operation. “The UXM’s powerful and flexible platform architecture allows us to address these new requirements and future requirements of the latest high-performance LTE-Advanced chipset and UE designs.”