BGA Interposer solution probes DDR4 x16 designs

18th February 2015

Keysight Technologies (formerly Agilent)

Mick Elliott

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Datasheet

Keysight Technologies has introduced a new ball grid array (BGA) interposer solution for testing DDR4 x16 DRAM designs with a logic analyser. The interposer solution provides fast, accurate capture of address, command and data signals for debugging designs and making validation measurements.

The Keysight W4631A BGA Interposer solution for use with a logic analyser, is used with Keysight’s E5849A probes for high-data-rate DDR4 DRAM designs.

As the industry transitions to DDR4 data rates up to 3.2 Gb/s, engineers working on next-generation memory systems – such as those used in servers and embedded devices – face significant challenges. Probing and accurate signal capture are becoming increasingly critical for debug and validation of new designs.

The W4631A interposer solution solves probing connectivity by providing access to DDR4 x16 DRAM signals critical to debug and validation efforts. The probe works in many existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DRAM with a DDR4 96 ball riser (included) or an optional 3rd party socket (not provided), enabling operation and acquisition of high-speed DDR4 signals with low loading and minimal impact to signal integrity on embedded system design. The interposer solution is designed to be used with the U4145B logic analyser system.

The interposer is designed for data rates up to 3.2 Gb/s. The probes are used with the U4154B logic analyser to perform functional tests.