White Paper Describes Semiconductor Characterization and Parametric Test Challenges

It also addresses the emerging market forces that are shaping the test solutions Keithley is offering the industry, including the rising demand for non-volatile memory, larger data sets, increased device reliability testing, the interest in power conversion/efficiency devices, and the test requirements associated with new semiconductor materials.



The white paper also describes Keithley’s solutions for these semiconductor test challenges, including:



· Series 2600A System SourceMeter Instruments

· Model 4200-SCS Semiconductor Characterization Systems

· Automated Characterization Suite (ACS) Systems

· Other high-speed, high-accuracy instruments