Test & Measurement
Keithley Publishes 2010 Test & Measurement Product Catalog CD
Keithley Instruments, has published its 2010 Test & Measurement Product Catalog in CD form. The CD offers details and technical specifications on Keithley’s general-purpose and sensitive sourcing and measurement products, DC switching, RF/microwave switching, data acquisition solutions, and semiconductor test systems.
UsefThe CD is arranged by product type and application area with sections containing Keithley’s newest offering in test and measurement:
· Digital multimeters and systems
· Switching and control
· RF/microwave switching
· Power supplies optimized for telecom device test
· Source and measure products
· Low level measurements and sourcing
· Function/pulse/arbitrary/pattern generators
· Semiconductor test
· Optoelectronics test
· Data acquisition products
· Accessories
Keithley’s 2010 Test & Measurement Product Catalog CD includes several new and enhanced products:
· Basic, low current, and high voltage versions of the S530 Parametric Test System.
· A variety of software and hardware enhancements to the company’s popular Model 4200-SCS Semiconductor Characterization System, including new support for solar cell testing and C-V measurements.
· An enhanced version of Keithley’s ACS Basic Edition software, which supports combining high speed hardware control, device connectivity, and data management into an easy-to-use tool for part verification, debugging, and analysis.
· A growing range of applications for Keithley’s Series 2600A System SourceMeter® Instruments.
· The Model 3731 6x16 reed relay matrix card, the latest addition to the Series 3700 System Switch/Multimeter family.
Keithley's 2010 Test & Measurement Product Catalog CD is available on request at http://www.keithley.info/catalogcd10.