Boundary scan tools head to IPC Apex in San Diego

The new Tool JT 5705 series will take pride of place. This new design concept incorporates both JTAG/boundary-scan controller functions and mixed-signal I/O channels. Extensive input protection is provided to ensure high levels of in-service reliability and low maintenance. Connection to the tester is via a USB interface.

The first in the series - JT 5705/USB - is supplied as desk-top instrument, primarily aimed at hardware validation applications in design, small-scale production test and in some cases field service and repair. It features two 15 MHz TAPs and 64 I/O’s available through 0.1in IDC connectors. 56 of the I/O channels are always digital, 16 of which also feature a frequency function.

The remaining 8 channels can be used as either digital I/O or analogue I/O. The unit also contains a user programmable FPGA facilitating application specific digital I/O options. Via the built-in ‘Multi-Sync’ feature several JT 5705/USBs can be combined into a single JTAG controller providing multiple TAPs and hundreds of I/Os.

The second model in this new range is the larger JT 5705/RMI, a 1U high 19in rack-mountable instrument for use in systems or as a bench-top tester. This unit features four 15 MHz TAPs and 4 groups of 64 mixed-signal I/O channels providing a total of 256 I/O’s available through 0.1” IDC connectors. As before, within each 64 channels group, 56 channels are permanently digital with 16 available as frequency inputs. The other 8 channels of each group can be individually programmed as digital I/O or analogue I/O channel. Furthermore the JT 5705/RMI features a total of 4 user programmable FPGA’s for creating application specific digital I/O options.

The I/O capabilities as provided by the JT 5705/USB are also available in a separate I/O module, the JT 5112 Mixed-signal I/O scan module, or MIOS. The MIOS module can be used in combination with existing JTAG Technologies boundary-scan controllers such as JT 3705, JT 3710 and JT 37x7 adding analog I/O capabilities to those controllers.

MD Peter van den Eijnden is convinced of the new solution: ‘We received quite some market feedback on how the next generation of JTAG/boundary-scan testers should look and increasingly we have been asked to provide analog stimulus and measurements alongside more traditional digital I/O systems. The new JT 5705s provides all this and more in really convenient and low-cost package’.