Debugging capability strengthened by new probe

18th November 2014

IAR Systems

Mick Elliott

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Datasheet

IAR Systems’ I-jet Trace is a powerful probe providing extensive debugging and trace functionality. It delivers large trace memory capacities and high-speed communication via USB 3. It supports all ARM Cortex-M cores, including the new ARM Cortex-M7 core, with Embedded Trace Macrocell (ETM) capabilities.

Tracing every single executed instruction, ETM provides developers with unmatched insight into the microcontroller’s activities and enables them to find those million dollar bugs that are difficult or even impossible to find any other way. The new probe offers a memory capacity of 32 Msamples and is designed to take full advantage of the speed and current delivery of the SuperSpeed USB 3 communication port, enabling truly high-speed debugging.

It allows real-time trace clocking at up to 150 MHz and Serial Wire Output (SWO) using Manchester and UART, clocking at up to 200 Mbps. The trace data is collected by the C-SPY Debugger in IAR Embedded Workbench and can be visualised and analysed in various windows. The complete debugging solution provided by I-jet Trace and C-SPY also includes Power Debugging.

This technology provides developers with information about how the software implementation of an embedded system affects the system’s power consumption. I-jet Trace can be used together with IAR Systems’ probe I-scope, which lets developers know the power consumed by individual modules, detect if design flaws in the code are causing unnecessary power consumption and possibly extend battery lifetime.

I-jet Trace supports JTAG and Serial Wire Debug (SWD) clocking at up to 100MHz. USB 3.0 and USB 2.0 are supported. The probe can supply the target board with power entirely powered by USB 3, but can optionally also be used with external power.