High-bandwidth probe measures faster current transients
The CWTMini50HF current probe from Power Electronic Measurements (PEM UK) targets high-speed and high power-density power electronic applications. This higher bandwidth probe is ideal for measuring the faster current transients in today’s new semiconductor technologies where faster turn on and turn off times, higher blocking voltages and smaller circuits demand, smaller, higher temperature, faster current probes.
Using Rogowski technology, the CWTMini50HF extends the high frequency capability of the CWTMiniHF range to enable measurement of rise-times as fast as 12.5 nano-seconds with a small 100mm, 3.5mm thick coil having a high frequency (-3dB) bandwidth of 50MHz and a peak di/dt capability of 80kA/µs.
This is achieved without sacrificing the probe’s excellent immunity to interference from fast local dV/dt transients.
Initially the CWTMini50HF will be available in peak current ratings of 600A and 1200A and will feature a thin 3.5mm thick coil rated for 2kV peak insulation.
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