GOEPEL electronics to run Webinars on JTAG/Boundary Scan in October

“Despite the relative maturity of JTAG/Boundary Scan (as defined in IEEE 1149.1), this test technology is still new to quite a few test engineers. The intent of this Webinar series is to introduce novices to the concepts of Boundary Scan and to discuss different types of test applications enabled by this technology. Long-term users of JTAG/Boundary Scan may benefit in particular from the Webinar on ‘Advanced JTAG/Boundary Scan applications’, which introduces some novel concepts of combining Boundary Scan and other test techniques in order to extend the achievable fault coverage at the board and system level”, says Heiko Ehrenberg, Manager of US Operations at GOEPEL Electronics.