GOEPEL electronic continues Webinar Series on Automated Optical Inspection

The second webinar on February 10th focuses on the comparison of various test technologies, including manual inspection, In-Circuit Test (ICT), Functional Test, JTAG/Boundary Scan, and AOI. Defect types will be discussed, as well as if and how certain defects can be detected with these test methods.

The February 17th webinar will outline ways to integrate AOI systems in electronics manufacturing/production environment. Topics to be discussed are in-line, off-line, and hybrid integrations including examples for each of those options.

The final webinar in this series takes place on February 24th and will feature a discussion of various illumination strategies used in AOI systems, outlining how smart illumination schemes can provide enhanced defect detection.