GOEPEL electronics, Geotest and Aster Technologies to host Seminars on Design for Test

Attendees will learn how Boundary Scan test methods can be used for not only structural testing but also as an adjunct to functional test using the PXI platform. The seminars will include technical demonstrations of Boundary Scan tools and Functional Test development software and hardware.

Engineers, who are interested in the topics of Design for Test, PXI and functional test, or already utilize Boundary Scan PCB testing equipment as well as parties involved in test and validation are invited to attend. They are welcome to learn how to maximize DFT capabilities and optimize overall test strategies. It will be demonstrated how to enhance test coverage using Boundary Scan, configure and build Functional Test Systems using PXI, and gain knowledge about the integration of Functional Test and Boundary Scan PXI instrumentation and software.