Software modules upgrade boundary scan platform

The tools enable direct coupling of SYSTEM CASCON to CAE environments, e.g. Teradyne’s LASAR simulator. Concurrently, the import of DTIF vectors and timing sets provides opportunities to execute deterministic dynamic functional tests on board level and combine them with other procedures such as Boundary Scan (IEEE 1149.x) or in-system programming.

The ATPG/PFD IEEE 1445 are software modules integrated in SYSTEM CASCON supporting the so-called DTIF (Digital Test Interchange Format). It is particularly used as transfer medium between simulators and Automated Test Equipment (ATE). Simulators can virtually calculate the electronic behavior of circuitries, finally producing simulation vectors that are transported to an ATE system. Consequently, the ATE system is able to execute such test sets on a physical unit under test.

The ATPG IEEE 1445 (Automatic Test Pattern Generator) enables the import of respective test data in IEEE 1445 format into the SYSTEM CASCON environment, automatically generating a consistent test procedure out of this data base.

In addition to the vectors, the precise timing as well as the interaction between test pattern are included. That means the execution of dynamic test procedures. Imported vectors can be immediately visualised and interactively modified by ATPG included viewer/editor tools. Deviations of measured vectors from set values automatically activate a diagnosis processor. That means a powerful and convenient tool suite for IEEE 1445 applications.