Keithley Webinar Explores Fundamentals of Semiconductor C-V Testing

This one-hour seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. To register for this event, visit http://tiny.cc/Oj6Zm.

C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime. The Keithley webinar is targeted to engineers who are new to semiconductor materials and device testing, process and device engineers who would like to refresh their knowledge of this testing methodology, and characterization lab managers. Those attending the seminar will learn what C‑V testing is, the types of devices C-V testing can be used to characterize, who can use it, and the challenges associated with making C-V measurements.

Lee Stauffer is Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.