Test & Measurement

Yokogawa to feature latest generation of optical test instruments at ECOC 2009

8th September 2009
ES Admin
0
At ECOC 2009, Yokogawa Europe is featuring its range of test & measurement instruments for the optical communications sector, including a number of new developments. The rapid spread of high-speed optical networks has caused a dramatic increase in network traffic, resulting in 10 Gbit/s transmissions being used in metro and access networks as well as backbone networks. This growth has led to increased demands on manufacturers of communications equipment and devices, who need efficient and cost-effective test systems to boost their productivity and minimise costs.
At ECOC 2009, Yokogawa Europe is featuring its range of test & measurement instruments for the optical communications sector, including a number of new developments. The rapid spread of high-speed optical networks has caused a dramatic increase in network traffic, resulting in 10 Gbit/s transmissions being used in metro and access networks as well as backbone networks. This growth has led to increased demands on manufacturers of communications equipment and devices, who need efficient and cost-effective test systems to boost their productivity and minimise costs.

Yokogawa’s key product offerings in this sector include optical spectrum analysers and OTDRs (optical time-domain reflectometers). New models in the Yokogawa AQ6370 Series of optical spectrum analysers include products that offer a major price/performance improvements in typical telecommunications applications compared to earlier models.

Featuring major enhancements in measurement throughput along with increased accuracy, resolution and lightweight construction, the new instruments are ideally suited to measuring the quality of optical communications equipment and optical components in the latest generation of high-speed 10 Gbit/s and 40 Gbit/s networks. The high measurement speed is complemented by dramatically improved data transmission speed and response speed under remote control conditions, enabling the typical measurement time in an automatic production test system to be shortened dramatically.

The Yokogawa AQ6375 is the world’s first optical spectrum analyser to combine a wide wavelength range of 1200 to 2400 nm with high resolution - between 50 pm and 2 nm - and high sensitivity of -70 dBm or better. The AQ6375 is a compact, easy-to-use high-resolution optical spectrum analyser for the 2 µm wavelength band. As such, it is uniquely suited to address the test requirements of 2 µm optical passive components and light sources such as the latest thulium lasers.

The AQ6375 is particularly aimed at supporting the research and development of new-generation high-performance optical laser sources such as optically pumped semiconductor disk lasers (OPSDLs) in the 1.2-2.4 µm wavelength area, which are attracting interest in environmental sensing and security applications.

In the OTDR product family, six new models have been added to the Yokogawa AQ7275 Series of optical time-domain reflectometers (OTDRs), extending its range of applications to cover virtually all metro, access and core networks as well as FTTH (fibre to the home) and PONs (passive optical networks).

Key elements of the new models, which bring the total number of products in the AQ7275 Series to nine, include a wider range of wavelengths and enhanced dynamic range (up to 45 dB). High dynamic range is effective for measurements on long-distance fibre transmission lines incorporating splitters with large losses.

All models in the AQ7275 Series feature a short event dead zone of only 0.8 m, allowing them to detect closely spaced events in cables installed in customer premises.

The instruments also offer exceptional ease of operation, with the set-up mode selectable according to the skill level of the operator. When combined with the quick start-up capability - 10 seconds from power-up to taking a measurement - this makes the AQ7275 Series a major potential contributor to efficiency and productivity.

Featured products

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier