Test & Measurement

eBook examines RF solutions for test and measurement

19th August 2024
Mick Elliott
0

Mouser Electronics has released a new eBook in collaboration with Analog Devices (ADI), exploring the world of high-performance instrumentation and the crucial role that ADI's precision technology, as well as its high-speed and RF solutions, play in enabling cutting-edge advancements in test and measurement applications.

The Role of Instrumentation in Modern Technology gives a deep dive into the ever-increasing demands for precision, speed, and efficiency in modern test and measurement instruments and how ADI's technology portfolio empowers engineers to overcome these challenges, unlocking new possibilities.

With ADI solutions already making a tangible impact across multiple industries and scientific disciplines, electronic test and measurement is vital to a whole range of activities, from simple voltage and current measurements to complex signal analysis and system diagnostics. The eBook features many of ADI's products that help bridge these challenges:

ADI's ADL5960 10 MHz to 20 GHz network analyzer front end includes a bidirectional resistive bridge, down-conversion mixers, programmable IF amplifiers and filters, and a versatile local oscillator (LO) interface.

Mouser also offers the AD4630-24 and AD4632-24 dual channel 24-bit SAR ADCs. These devices feature simultaneous sampling, Easy Drive, and 2MSPS or 500kSPS for medical and scientific applications.

The ADA4510-2 RRIO Op Amps, also available from Mouser, are high-precision, dual-channel amplifiers with a 40V capability that suit signal chain applications like sensing, conditioning, and output drives.

ADI's ADuM340E/ADuM341E/ADuM342E 5.7kVRMS quad digital isolators incorporate a high-speed, complementary metal-oxide semiconductor (CMOS) with back-to-back monolithic air core transformer technology based on iCoupler technology, allowing compatibility with lower voltage systems to enable voltage translation functionality across the isolation barrier.

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