Curve tracer for parametric testing of high-speed devices

17th December 2008

ES Admin

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A high-speed, high-accuracy real-time V/I curve tracer that is ideally suited to carrying out DC parametric testing on semiconductor and optoelectronic devices has been introduced by Yokogawa Europe. The new compact, lightweight unit consists of the Yokogawa GS820 multichannel source measure unit and the 765670 curve tracer software, which runs on a PC connected to the GS820 via a USB link.

The GS820's high-speed communication and sweep features allow high-speed real-time updating of the graphical display at a rate up to 20 pages per second. The instrument is designed for ease of setup and operation, with screens guiding the user through the setup process and the selection of sweep range, graph axes, measurement range and measurement conditions.

Curves can be based on various combinations of current and voltage inputs along with time-stamp references. Sweep shape can be set to ramp (linear or logarithmic), triangular (linear or logarithmic) or rectangular, and the number of sweep points can be 5, 10, 20, 0, 100, 200 or 1000. In addition to facilities for scaling and averaging, the unit offers a number of analysis features including cursor, zoom, scroll and reference curve designation. File operations include CSV data storage and loading, graphic image storage, panel image storage, and setup storage and recall. The curve tracer is ideally suited to DC parametric testing of devices such as discrete semiconductors, analogue ICs, MOS logic and other digital ICs, LEDs and other optical devices, and solar battery cells.