Test & Measurement

Boundary Scan Software Platform SYSTEM CASCON automates hierarchical Test of Multi Chip Modules

30th March 2010
ES Admin
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GOEPEL electronic introduces new features to specially support hierarchical tests of Multi Chip Modules (MCM) as new extension of its software platform SYSTEM CASCON. The enhanced tools provide a hitherto unrivalled automation level for the generation of module and board centric Boundary Scan tests based on hierarchical library models.
“In practice, Multi Chip Modules play a highly important role to implement system-on-chip designs with integrated IEEE 1149.1 structures. Our new system features help to improve the efficiency of hierarchical test generation”, says Thomas Wenzel, Managing Director of the Boundary Scan division of the GOEPEL electronic GmbH. The MCM models’ full independence from target board design ensures a complete portability of the entire package, and releases users from handling hierarchical CAD and Boundary Scan data.”



The core elements of the new solution are further developments of the graphical library section integrated in SYSTEM CASCON™. Now it is possible to administrate IEEE 1149.1 Multi Chip Modules as system-in-package (SiP). Thereby, SiP models may consist of a mix of Boundary Scan and non-Boundary Scan chips and dies, mounted in housings or stacked in a Package on Package (PoP) technology.



The new model type includes all structural and functional information required to describe an MCM, as well as package and constraint section. The models can be completely ported to additional libraries, and can furthermore be imported and exported. They can interactively be created directly in the library environment by means of respective form generators.



During project generation, the Multi Chip Modules’ existence is automatically recognised and a hierarchical project data base generated. The original description completely remains, i.e. that all tools for Automated Test Program Generation (ATPG), Flash/PLD in-system programming (ISP), graphical debugging as well as automatic diagnosis on MCM and board level can be used without limitations.

The automatic consideration of the hierarchical constraints guarantees highest safety for scan vectors in all processes. The models’ complete independence of the target unit under test (UUT) enables a data management either locally on the work station or centrally on a server.



The new features for hierarchical MCM testing are integrated as standard in the platform license from SYSTEM CASCON™ version 4.5.2.

The professional JTAG/Boundary Scan development environment SYSTEM CASCON™ has been created by GOEPEL electronic, and includes more than 40 completely integrated ISP, test and debug tools. For users with a valid software maintenance contract the release is free of charge.

The MCM models can be generated by users themselves or provided by GOEPEL electronic.

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