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TEST-OK Functional Test Equipment Integrated With Boundary Scan

11th December 2012

ES Admin

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Within the scope of an OEM cooperation, GOEPEL electronic and TEST-OK have developed a professional Boundary Scan option for the TEST-OK functional test system. The new integration solution is based on a specially developed plug-on module named UCM1149. The full integration of GOEPEL electronic’s Boundary Scan software and hardware in the TEST-OK test concept offers several benefits, such as higher test depth and fault coverage as well as cost reduction.

A large number of microcontrollers and memories can be programmed in-circuit by the GOEPEL electronic Boundary Scan system. The TEST-OK system provides two Boundary Scan TAPs ready for use on any bed of nails. GOEPEL electronic’s Boundary Scan software SYSTEM CASCON is started by TEST-OK’s powerful TEST-TRACK functional test software. The Boundary Scan test results are stored in the TEST-TRACK database, together with the functional test results. All Boundary Scan routines are written with the power of the SYSTEM CASCON software.

“The integration of both functional and Boundary Scan test opportunities leads to a considerably higher fault coverage, compared to separated utilizations”, explains Alexander Beck, GOEPEL electronics’ integration expert with the Boundary Scan Division. “Additionally, we are now able to provide customers another Boundary Scan integration in an existing ATE system. Hence, the cooperation with TEST-OK is important strategic step towards offering high fault and test coverage to help in achieving best test results as well as product quality.”

“Considerable advantages of combining the two test methods are a shorter total test time and less handling of the PCB board”, adds Hans Roelvink, General Manager of TEST-OK. Nowadays there are many cases in which Boundary Scan compatible devices are involved. After the integration of the two test methods new roads towards controlling the microcontroller can be explored.”

The TEST-OK test system offers the benefits of a functional test system that is testing the functions of the complete electronic system and an in-circuit test system which can check for shorts, opens, resistance, capacitance, and other basic quantities which will show whether the assembly was correctly fabricated. With the integration of Boundary Scan functionality of GOEPEL electronic the TEST-OK test system now offers the additional benefits of testing interconnects and clusters of logic, memories etc. without using physical test probes.