Tutorial reviews IEEE IJTAG standard
Coinciding with a major step toward final approval of the new IEEE P1687 Internal JTAG (IJTAG) standard for embedded instruments, a new tutorial explains how IJTAG can streamline the validation, test and debug of both the semiconductors where instruments are embedded and circuit boards where they are deployed.
Written by Al Crouch, vice chairman of the IEEE P1687 IJTAG working group and chief technologist for ASSET InterTech, the “IEEE P1687 IJTAG Tutorial – Second Edition” is based on the version of the IJTAG document that received the recommendation of the IEEE Standards Review Committee on Oct. 15, 2014.
The tutorial reviews why IJTAG was developed and describes how engineers can apply an on-chip network of IJTAG instruments in chip and circuit board test applications.
“The IEEE P1687 IJTAG standard will help design, test and manufacturing engineers because it gives them an alternative to legacy external test methods which are becoming less effective as chips and systems increase in performance and complexity,” said Crouch. “Tutorials like this one will further accelerate the adoption of IJTAG in the industry. We’re already seeing the emergence of an IJTAG ecosystem among the various tools vendors, such as ASSET.”
The “IEEE P1687 IJTAG Tutorial – Second Edition” is available now on the ASSET website in its eResources centre.
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