eBooks explore IEEE test standards
A new series of eBooks on three IEEE standards – IJTAG, JTAG and 1500 ECT – explores why and how all three can be used by validation, test and debug engineers who are working with instrumentation embedded in chips and on circuit boards. Authored by Al Crouch, vice chairman of the IEEE 1687 Internal JTAG (IJTAG) standards committee and a chief technologist for ASSET InterTech), the first two eBooks in the series are an Introduction Tutorial and a Technical Tutorial.
“I wanted to explain why several standards, each a very good standard in its own right, come into play in one technology area like embedded instruments. This is actually a pretty common occurrence,” Crouch said. “The second eBook in the series came about because I realized engineers really want to know the technical details concerning how the standards work and how they interact. So, after I explained the issues in the Introduction Tutorial I wrote the Technical Tutorial.”
Either or both eBooks can be downloaded for free from the ASSET InterTech website’s eResources centre. The books are “IJTAG vs JTAG vs 1500 ECT | Introduction Tutorial” and “IJTAG vs JTAG vs 1500 ECT | Technical Tutorial
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