O/E modules address optoelectronic device testing up to 110GHz

28th September 2015

Mick Elliott

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Datasheet

The MN4765B series of O/E modules for Anritsu’s MS4640B VectorStar Vector Network Analyser (VNA) family creates a cost-effective and flexible solution for measuring 56Gb/s components and transceivers used in telecommunications and data communications applications. The module, combined with the VNA, provides a simplified approach for optoelectronic measurements and is an economical alternative to conventional total-system approaches currently used in R&D and manufacturing environments.

Magnitude and phase characterisation is acquired using a primary standard characterised by NIST and conducted in the Anritsu calibration lab. The result is improved measurement uncertainty when the module is used with VectorStar across the wide frequency range of the VNA. Using the module, the VNA can conduct accurate, traceable corrected transfer function, group delay, and return loss measurements of E/O and O/E components and subsystems.

The optical modules are designed with an InGaAs photodiode that converts modulated optical signals to electrical signals. The photodiode has exceptional bandwidth response to 70 GHz and 110GHz. Additional circuitry for temperature and bias stability are also incorporated into the modules.

Anritsu will also launch an option for the MN4765B that will allow the module to be used with the ME7838x series Broadband VectorStar VNA for accurate optoelectronic measurements over an industry-best 70kHz to 110GHz in the 1550nm range.

The broadband configuration extends the applications in which the optoelectronic solution can be used to universities and research labs. Because it uses a NIST-characterised photodiode as the primary standard, it is a superior approach to the current methods relying on a non-characterised diode resulting in uncertainties of 3-5dB.