Anritsu demonstrates a 3G LTE Virtual Network Demo

The test system hooks up the MF6900A Fading Simulator with the MD8430A Signalling Tester to allow the creation of a 3G LTE virtual network. This offers throughput fading tests to be undertaken with uplink speeds of 50 megabytes and downlink speeds of 100 megabytes. The system operates in a 2 by 2 MIMO environment.

Anritsu will also demonstrate 3G LTE receiver and transmission evaluation tests using MG3700A vector signal generators and MS269xA-series signal analyzers in conjunction with LTE chipsets, base stations and terminals.

LTE is the next-generation mobile communication service planned to be introduced in 2010, by telecom carriers in Japan, Europe and the United States. Since LTE is an IP-based wireless technology, its application is expected to spread, from mobile phones to wide range of fields such as personal computers, car electronics and digital home appliances.

Anritsu will introduce LTE measurement solutions realized by the latest technologies and partnerships with global customers at the Anritsu Booth, at the very period LTE research and development races towards 2010.