Anritsu and Y.I.C. join to deliver EMI solutions

Anritsu’s new Field Master spectrum analyzers complement the Y.I.C EMScanners and EMViewer application software to provide a fully integrated solution.

Design engineers developing advanced electronics face increased EMC challenges from high-speed data circuits and RF components.

Efficient design processes necessitate early insight into the EMC performance of the circuits. The Y.I.C scanners and EMViewer software coupled with Anritsu spectrum analyzers provide a unique 3D heat map of all radiated signals.

Circuit layout and shielding materials can be optimized before submitting the product to a certified test house, maximizing the chances of a first-time pass and minimizing repeated submissions.

“Our passion is to work and help engineers improve their time spent troubleshooting EMC challenges. With our solutions which is now compatible with Anritsu Field Master spectrum analyzers we offer a unique way to look at your design and give you the opportunity to fix all the issues in the near field, which will guarantee a first-time pass at the chamber. We are excited about this partnership and look forward to welcoming all Anritsu users to our EMC family” says Cornelle Roberts, Global Sales & Channel manager at Y.I.C. Technologies.

EMC testing is an increasingly important part of product development, especially in the Aerospace & Defense and Medical Electronics markets. Efficient product development requires specialized design tools and Anritsu are delighted to partner with Y.I.C Technologies to deliver effective solutions for this market.

“Anritsu is proud to partner with Y.I.C Technologies to help bring their innovative solutions to market. EMC testing is an increasingly important part of the test industry market and the EMScanner and EMViewer products provide our common customers with deep insights at a speed never before possible” says Angus Robinson, Spectrum Analyzer Product Manager at Anritsu.