X-Parameters test technology covered in new book

31st October 2013

Keysight Technologies (formerly Agilent)

Mick Elliott

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Agilent Technologies has released “X-Parameters: Characterization, Modeling, and Design of Nonlinear RF and Microwave Components,” a book on the company’s nonlinear X-parameters measurement, modeling and simulation technology. Published by Cambridge University Press, the book offers readers the definitive guide to X-parameters theory, including real-world examples.

The book was written by Agilent scientists and engineers David E. Root, Jan Verspecht, Jason Horn and Mihai Marcu, four of the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. The authors are recognised across industry and academia as leading experts in modeling, simulation and measurement science.

The book lays the foundations for X-parameter technology and provides practical cases that give readers useful approximations. These approximations can be used to greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. The book also teaches readers how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering.

The book also contains real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions. With such an array of content, it is the definitive stand-alone reference for researchers, engineers, scientists and students who want to remain on the cutting edge of RF and microwave engineering