Agilent Technologies to Demonstrate Industry-First USB 3.0 Tests with NEC's USB 3.0 Host Controller at Developers Conference

USB 3.0 is an update of the well-established, widespread standard driven by USB Implementers Forum Inc., a non-profit corporation founded by the group of companies that developed the Universal Serial Bus (USB) specification. USB receiver jitter tolerance testing became mandatory with the recent release of the USB 3.0 specification version 1.0. USB 3.0 is also known as SuperSpeed USB.



NEC Electronics' USB 3.0 host controller is the industry's first USB 3.0 product. NEC Electronics offers both USB 3.0 host controller and device silicon for end-to-end product coverage of the USB 3.0 market. The company has completed full receiver jitter tolerance test verification as required by the USB 3.0 specification and transmitter test requirements.



Agilent offers a complete USB 3.0 test solution for transmitter and receiver test, comprised of a DSA91304A Infiniium oscilloscope, a USB 3.0 test fixture, a pattern checker and pattern generator based on the J-BERT N4903A/B high-performance serial BERT, an N5181A MXG RF analog signal generator, 81150A pulse function arbitrary noise generator and the N5990A test automation software platform from Agilent's partner BitifEye Digital Test Solutions.



With this live demo of the USB 3.0 transmitter and receiver test products using a customer device, Agilent proves its leading position, said Jim Choate, USB program manager with Agilent's Digital Test Division. We are working closely with developers of SuperSpeed USB technology to ensure our solutions completely meet the needs of engineers testing for USB 3.0 compliance.



NEC Electronics has been a proven leader in USB product and IP development and we appreciate the cooperation with Agilent very much, said Katsuhiko Itagaki, general manager, SoC Systems Division, NEC Electronics Corp. We are looking forward to introducing our industry's leading accomplishment though this joint demonstration.