Agilent Technologies Launches In-Circuit Test Series

1st September 2009

Keysight Technologies (formerly Agilent)

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Agilent has introduced the Medalist i3070 Series 5 in-circuit test (ICT) platform, marking 20 years since the company launched its award-winning 3070 and i3070 ICT systems. The Series 5 ICT system offers new analog measurement technology together with the industry's fastest 12 MHz hybrid pin card, giving electronic manufacturers 20 to 30 percent throughput improvement over the current i3070 at the same list prices. This enables contract manufacturers to considerably reduce their cost of test while increasing coverage.

The Series 5 ICT system also offers a new infrastructure that allows manufacturers to incorporate external circuits easily for added test coverage while providing better control of those circuits. Instead of having multiple sets of external circuits in multiple fixtures, manufacturers can now put the external circuits in the testhead. This way, they need only one set per tester, which can save them significant test costs. Agilent has already identified partners to provide high-speed flash programming solutions, LED testing and boundary-scan solutions via these external circuits.

Current users of i3070 and 3070 PC systems can run most of their ICT programs seamlessly on the new Series 5 tester. Fixtures built since the introduction of the 3070 remain compatible, protecting the manufacturer's investment.

Cost of test is a critical challenge for our customers, said Daniel Mak, vice president and general manager of Agilent's Measurement Systems Division. The i3070 Series 5 enables reduction in cost of test without sacrificing any coverage. With a 20 to 30 percent ICT throughput improvement, customers can improve test efficiencies enabled by the new and improved source measurement engine in the Series 5 ICT system. And the addition of external circuits removes expensive test steps from their test processes.

The Series 5 ICT system addresses a broad array of in-circuit and functional test needs, including IEEE1149.6 boundary-scan standard testing and limited-access test applications for highly complex and small-footprint boards in sophisticated consumer electronics, data communication, automotive, aerospace and defense and medical applications. The test system has been able to test low-voltage components reliably since the introduction of the 3070.