IoT test solutions debut at Semicon West

Two products will make their debuts.

The T5833 system, capable of wafer sort and final test of virtually any NAND Flash or DRAM devices, and the T2000 28G OPM, the company’s first module designed for testing high-speed optical transceivers used in sending and receiving data through optical fibres.

Other booth displays will highlight the V93000 platform’s capabilities in improving time to quality (TTQ) in multi-site radio-frequency (RF) applications and testing IoT devices;the M4871 and M6245 test handlers for system-on-chip (SoC) and memory ICs; the T2000 ISS for at-speed testing of fast CMOS image sensors; the T2000 IPS for integrated power device test solutions; and the T6391 all-in-one system for testing high-speed, high-pin-count display driver ICs (DDI).

For advanced metrology and nano-patterning applications, the booth will include exhibits on Advantest’s TS9000 terahertz measurement systems, used in non-destructive inspection of IC mold thickness and electrical fault analysis TDR; the company’s line of E3310, E3640 and E5610 SEMs for inspecting next-generation wafers, photomasks and blanks; and the F7000 e-beam lithography tool for nano-processing challenges at the 10-nm technology node and below.

Also showcased in the exhibit will be demonstrations of an EVA100 tester for digital and analog testing of small-pin-count semiconductors; Advantest’s CloudTesting Service; and SmartBox -- a production and point-of-sale diagnostic test solution for smart phones, tablets and IoT devices. SmartBox was developed by W2BI, a member of the Advantest Group.