ACS Test System Now Completes Wafer Level Reliability Testing up to Five Times Faster

Together, the new Reliability Test and Data Analysis tools allow ACS-based test systems to produce lifetime predictions as much as five times faster than traditional WLR test solutions. By accelerating WLR testing during the technology development, process integration, and process monitoring phases of creating new integrated circuits, ACS systems can reduce time to market for new products significantly.

ACS-based test systems have the hardware configuration flexibility necessary to address a wide range of semiconductor characterization needs at the device, wafer, or cassette level. They can incorporate either Keithley’s Series 2600 System SourceMeter® instruments, the company’s Model 4200-SCS Semiconductor Characterization System, or both.