Test & Measurement

Tektronix has announced what it says are the the world’s fastest active differential probes to complement its new four-channel real-time oscilloscopes featured elsewhere in electronicspecifier. The new P7500 probing family sets industry benchmarks for bandwidth, provides superior signal fidelity with fast risetime and low circuit loading, introduces unique patent-pending TriMode measurement switching, and a new “needle nose” form factor. T...

Tektronix has announced the introduction of an ultra-high performance oscilloscope with 20 GHz real-time bandwidth and 50 GS/s simultaneous sampling rate. The DSA70000 Digital Serial Analyzer (DSA) oscilloscope family includes several new models – 20 GHz DSA72004, 16 GHz DSA71604 and 12.5 GHz DSA71254.

The TAP1500 high-speed active probe for the Tektronix DPO4000 and DPO7000 families of oscilloscopes is now available from TTi (Thurlby Thandar Instruments). The new 1.5 GHz single-ended active FET probe provides the excellent high-speed electrical and mechanical performance required for the real-time testing and debugging of today's digital system designs.

Microchip has announced the PICkit Serial Analyzer which enables design engineers to easily and cost-effectively interface with embedded circuits within serial systems using any Windows-based PC. The new PICkit Serial Analyzer comes complete with a 28-pin demo board featuring the 8-bit PIC16F886 microcontroller. The kit’s hardware and Graphical User Interface software allow testing and debugging of communication between the PC and several indu...

Measurement Computing Corporation has announced the release of two new counter/timer devices for the USB bus. The USB-4301 is a 5-channel, 16-bit counter/timer with one 8-bit dedicated input port, and one 8-bit dedicated output port. It is based on the powerful 9513 series chip. The USB-4303 is a 10-channel version, based on two 9513 series chips. The new products emulate Measurement Computing’s reliable PCI-CTR05 and PCI-CTR10 counter/timer cl...

Keithley Instruments has published Parallel Test Technology: The New Paradigm for Parametric Testing, a semiconductor parametric test handbook. The 60-page handbook offers an overview of the emerging test technique known as parallel parametric testing, a strategy for wafer-level parametric testing that uses concurrent execution of multiple tests on multiple scribe line test structures and helps semiconductor fabs maximize their test throughput a...

The Cropico DO4A is a highly versatile digital ohmmeter used for low resistance measurement across a diverse range of electronic design and manufacturing applications. Of particular relevance is the instrument’s role in the precision resistance measurement of electronic components and switches as well as electrical connectors, crimp joints, fuses and similar products.

Clare Instruments has developed a new hi-pot flash tester and scanner for the functional and quality validation of a wide range of electronic components. The microprocessor controlled H2 Hal Scan can be used to confirm the safety, integrity and performance of semiconductor devices, interconnections, wound components (including transformers), switches and similar devices used in the manufacture and assembly of electronic and electrical products.

Clare Instruments, part of the Seaward Group, has recently upgraded its bespoke custom electrical test design service for manufacturers of electrical and electronic products. Clare has developed a broad range of fully programmable electrical safety and functional test instruments that can be adapted and integrated for use in bespoke test systems, using proprietry software such as LabView.

The new Cropico DO7010 portable digital microhmmeter has been developed for a wide range of electronic engineering and manufacturing applications requiring accurate low resistance measurement.