Test & Measurement
Resistance Decade Boxes from Cropico feature high accuracy
Precision measurement specialist Cropico, part of the Seaward Group, has introduced a versatile range of resistance decade boxes. The company’s range includes a series of 5, 6 and 8 decade boxes which have been designed to provide highly accurate and variable standard values of resistance and current for calibration, comparison and test applications in the electronics design laboratory or maintenance workshop.
Measurement Accuracy and Reliability improved with NI LabVIEW SignalExpress 2.5
National Instruments has announced the release of LabVIEW SignalExpress 2.5, the interactive measurement software that simplifies the acquisition, analysis and presentation of data from hundreds of data acquisition devices and instruments. Built on NI LabVIEW graphical programming, LabVIEW SignalExpress delivers an easy-to-use, drag-and-drop environment for configuring data-logging and instrument control applications. The latest version of LabVI...
8G Fibre Channel Load Tester for Storage Area Networks from Finisar
Finisar Corporation has announced the availability of its new XgigÒ 8G Fibre Channel Load Tester. The Xgig platform is used by developers and SAN architects worldwide to test, analyze, and validate the performance of the entire spectrum of Fibre Channel SAN equipment, ranging from chips to large scale systems. With this new load tester Finisar now provides full line-rate load testing for the new generation of 8 Gb/s Fibre Channel products. Th...
Switch probe for rear assembly
Peak Test Services has introduced a new version of the P201/G switch probe that has been specially designed for rear assembly in applications such as multi-level modules and fixtures. The rear assembly allows efficient, simple and quick replacement, with the probe being screwed into the receptacle from below without having to dismantle the fixture or module.
National Instruments and Anritsu Collaborate on NI LabVIEW, LabWindows/CVI Instrument Drivers for Anritsu Instrumentation
National Instruments and Anritsu Company have announced a joint effort to develop LabVIEW Plug and Play and LabWindows/CVI instrument drivers for Anritsu test instruments. The companies are working together to make it easy for engineers and scientists to combine the popular LabVIEW graphical development platform and the proven LabWindows/CVI ANSI C integrated development environment with Anritsu RF and wireless communications test instruments.
PC Oscilloscopes from Pico offer 16-bit resolution
The PicoScope 3224 and 3424 high-precision PC Oscilloscopes are now able to offer 16-bit resolution when used with the latest PicoScope 6 software release. They now also offer fast USB streaming when used with the new software. The fast streaming mode operates automatically whenever the user selects timebases of 200 ms or slower. In fast streaming mode, the sample rate can now be as high as 256 kilosamples per second depending on the PC in use...
PXI Express System Timing Controller is a first says National Instruments
National Instruments has announced the latest additions to NI timing tools including the industry’s first PXI Express timing and synchronisation controller and a PXI module that synchronises PXI systems over GPS, Inter-Range Instrumentation Group (IRIG) and IEEE 1588. With these new products, engineers can achieve improved synchronisation and timecode capabilities in PXI systems, which is important for synchronising multiple systems, precisely ...
Aeroflex introduces a synthetic test environment
At European Microwave Week 2007 Aeroflex announced the commercial availability in Europe of its new Synthetic Multifunction Adaptable Reconfigurable Test Environment (SMART^Eä). SMART^E introduces a truly synthetic test environment that includes hardware, software, test practices and support required by customers for a complete test solution.
RF test platform for seamless migration from research and development to production test
Aeroflex has introduced its new modular RF test platform for wireless applications up to 6GHz. The scaleable platform has the flexibility to easily perform at any stage of wireless development from research to manufacturing, and can integrate seamlessly into any wireless market including cellular, wireless data, RFIC test and military/aerospace.
LeCroy launches new 13 GHz Oscilloscope
LeCroy Corporation announces the launch of a new 13 GHz Test Solution for next generation serial data standards. Comprised of the SDA13000 Serial Data Analyzer, the D13000PS Active Differential Probe, and a suite of innovative debug and analysis tools, LeCroy’s system goes beyond compliance testing to provide the most powerful methods for next generation serial data bus design, development and debug available today. With a bandwidth of 13 GHz, ...