Test & Measurement
Low-Cost PXI Embedded Controllers for Test, Measurement and Control Applications from NI
National Instruments has announced two new low-cost embedded controllers – the PXI-8104 and PXI-8183 – that deliver exceptional performance for value-based test, measurement and control applications. With these new controllers, engineers and scientists can apply PXI in a variety of new applications across many industries including consumer electronics, automotive, semiconductor, telecommunications and aerospace and defense.
Universal Cable Test Kit for Wi-Fi and Broadband Applications
Wireless, Wi-Fi and Broadband infrastructure installation requires cables for RF and data throughput. Testing these cable assemblies in the field can be difficult with the variety of unique connectors available today as well as the popular reverse polarity styles. The RFA-4028-WIFI kit by RF Connectors, a division of RF Industries, simplifies the task.
PC-based data-acquisition system is easy to use
The Yokogawa SL1000 is a PC-based data-acquisition unit designed to provide high-speed data logging and fast data transfer in electro-mechanical and power measurement applications. Featuring 100 MS/s sampling on 16 channels and isolated inputs for high-voltage measurements, the SL1000 is also equipped as standard with intuitive, easy-to-use logging and control software for quick start and set-up.
Analog Devices Expands Energy Metering Portfolio
Analog Devices is expanding its portfolio of market-leading energy metering solutions with the ADE51xx and ADE55xx single-chip metering devices, which are designed for the increasingly sophisticated communications networks used by today’s energy markets. Globally, solid-state energy meters are replacing failure-prone electromechanical systems, which are subject to meter tampering and cannot easily support new features such as remote meter-readi...
CETECOM introduces a FACTSware based A-GPS test solution
CETECOM has developed and introduced a new member of the FACTSware test platform family (TP86). The RF performance test cases which are required by GCF and PTCRB for A-GPS (Assisted Global Positioning System) have been implemented so that this new A-GPS test solution enables testing according to the 3GPP Test Specifications TS 34.171 (A-GPS Minimum Performance) and TS 51.010-1.
Arbitrary/function generator offers 40 V peak-to-peak amplitude
The AFG3011 arbitrary/function generator is the latest addition to the Tektronix AFG3000 Series of signal sources for design, test, and manufacturing engineers. While the vast majority of arbitrary/function generators provide a maximum of 10 V p-p amplitude into 50-ohm loads, a number of applications – particularly in automotive and power electronics design - require higher amplitudes.
National Instruments UK & Ireland Among Industry Leaders at Test & Measurement Design Day
National Instruments will join fellow industry leaders including Agilent, Anritsu, Tektronix, QualiSystems and Yokogawa, at the New Electronics Test & Measurement Design Day. Taking place at Reading’s Madejski Stadium on Thursday 15th May 2008, the one day conference and exhibition will focus on next generation test solutions, covering three technology based streams: wireless test, embedded test and software related issues.
Compact Tacho & Frequency Meter
The new PICA100-F tacho meter and frequency meter is now available from sensing & instrumentation specialists Vydas International Marketing. The PICA100F is a compact 1/32 DIN size and is designed for measuring frequencies, velocities in r.p.m. or lineal and is totally programmable. Manufactured by Ditel the instrument is one of the KOSMOS series of digital panel meters.
Aeroflex announces industry’s first reconfigurable avionics test platform - Avionics Test Bench and Avionics Test Studio
Aeroflex has announced the introduction of Avionics Test Bench and Avionics Test Studio, the first reconfigurable PXI-based test platform for avionics navigation and communications. Unlike stand-alone bench instruments, Aeroflex’s new avionics test system addresses test compatibility by leveraging PXI’s common platform and flexibility.
National Instruments LabVIEW Targets Industry-Leading ARM Microcontrollers
National Instruments and ARM has announced the NI LabVIEW Embedded Module for ARM Microcontrollers, an extension of the LabVIEW graphical system design platform that directly targets the ARM 7™, ARM 9™ and Cortex™-M3 microcontroller families. The module is the first product in an ongoing collaboration between the companies that combines the ease of use of LabVIEW with the performance of ARM microcontrollers.