Test & Measurement
How to build a compact data acquisition system
Data acquisition (DAQ) is a key function in a variety of research and engineering activities ranging from design validation and verification to accelerated life and production testing, among others. While the key elements of a DAQ system are straightforward: sensors, measurement hardware, and software; from there, things can get complicated.
Advantest picks R&S scope for SoC testers
Advantest has selected the R&S RTP high-performance oscilloscope for mass production evaluation of high-speed SoC testers.
Yokogawa launches optical spectrum analyzers
Yokogawa has launched two optical spectrum analysers (OSAs) to fulfil market demands for an instrument capable of measuring a wide range of wavelengths to meet new needs in optical product development and manufacturing.
Meet Lane Electronics at DVD2022
Lane Electronics, a franchised distributor for major electrical and electronic connector manufacturers, has announced they will be exhibiting at DVD2022.
Keysight, Nokia combine for 800GE test
Keysight Technologies has collaborated with Nokia to successfully demonstrate the first public 800GE test, validating the readiness of next-generation optics for service providers and network operators.
Rohde & Schwarz announces test solutions for 5G NR Release 17
Rohde & Schwarz is implementing a full range of 5G NR (New Radio) Release 17 features in its signal generation and analysis test solutions.
Jaguar Land Rover opens next-generation vehicle testing facility
Jaguar Land Rover has taken another step towards a new era of electrification and connectivity by opening a facility to test the next generation of vehicles for electrical and radio interference.
Top 5 Test & Measurement products in July
Electronic Specifier takes a look at the top Test & Measurement products to have been released in July.
Low resistance digital ohmmeter features noise rejection mode
Megger has added to its family of digital low resistance ohmmeters to include the DLRO2X.
Advantest enables PCIe gen 5 NVMe & CXL device testing
Capability integrated into engineering and high-volume manufacturing systems and device Interface boards.