Test & Measurement
Low-noise programmable linear Hall-effect sensors from Allegro feature high bandwidth
Allegro MicroSystems Europe has introduced the A1360/1/2 family of programmable linear Hall-effect sensor ICs feature extremely low noise levels and very high bandwidth, making them ideally suited to high-frequency automotive or industrial current sensing applications.
Low-cost Frequency Counter from TTi operates to 3GHz
The new PFM3000 from TTi (Thurlby Thandar Instruments) is a UK built hand-held frequency counter which can measure signals from below 3 Hz to above 3 GHz. Its low cost of £115 puts it into a similar price category as hand-held multimeters.
Semiconductor Device Test Applications CD from Keithley Semiconductor
Keithley Instruments has announced the availability of its Semiconductor Device Test Applications Guide. In addition to the Applications Guide, this CD also includes a large variety of semiconductor test application information such as applications notes, white papers, and presentations that enables users to reduce their cost of test while simplifying the most challenging applications.
Fast Bus-Powered Multifunction DAQ Devices for USB from National Instruments
National Instruments has announced the release of two new bus-powered M Series data acquisition (DAQ) devices for USB that deliver faster sampling rates and more digital I/O features than previously released bus-powered M Series devices for USB. The NI USB-6212 and USB-6216 are available with 68-pin SCSI mass termination, screw terminals or 50-pin IDC connectivity to provide multiple connectivity options.
Keithley Releases New Edition of Switching Handbook
Keithley Instruments has released the sixth edition of its Switching Handbook: A Guide to Signal Switching in Automated Test Systems. At more than 180 pages, this newest handbook covers the fundamentals of the switching function in test and measurement applications, providing useful, tutorial information on how to optimize switching test systems.
High-frequency differential probe for vehicle serial buses
The new Yokogawa PBDH1000 is a high-frequency differential probe designed to meet the challenges involved in the development and testing of in-vehicle buses such as CAN and FlexRay. The new probe, which is intended for use with the Yokogawa DL9000 Series of oscilloscopes or the SB5000 range of serial bus analysers, has a frequency bandwidth of DC to 1 GHz (-3dB or more), an attenuation ratio of 50:1 and a DC accuracy within ±2%.
Sensor Modules for direct measurement of current, voltage and temperature
Isabellenhütte’s IMC and IMS sensor modules have been developed for all areas of use in which large currents, voltages and temperatures have to be measured with high precision.
ACS Test System Now Completes Wafer Level Reliability Testing up to Five Times Faster
Keithley Instruments has enhanced its Automated Characterization Suite (ACS) software to include optional wafer level reliability (WLR) test tools for semiconductor reliability and lifetime prediction testing applications. Version 4.0 builds on the ACS software’s existing single- and multi-site parallel test capabilities, adding a database capability, as well as software tools and optional licenses for the new Reliability Test Module (RTM) and ...
SysNucleus releases new version of USBTrace with Wireless USB support
SysNucleus USBTrace is a software-based USB protocol analyzing tool. The tool helps USB firmware, device driver developers and test engineers to sniff the USB bus during the device development stage. USB requests passing through various layers of the USB device stack are captured and displayed in easily readable format.
Aeroflex announces early availability of its test suite for the C.S0044-A specification
Aeroflex has further enhanced its comprehensive support for CDG Stage II interoperability and CDG Stage I signalling conformance testing with the early availability of a test suite for the C.S0044-A specification.