Test & Measurement
Tektronix Provides First Published Test Procedure for SATA Revision 3.0 Physical Layer Tests
Tektronix has announced availability of the first published test procedures for physical layer testing of the Serial ATA Revision 3.0 standard. Tektronix provides a comprehensive high-speed serial data test suite for the SATA physical layer design and debug.
PulseCore Semiconductor Taps Tektronix USB Serial Test Suite
Tektronix has announced that PulseCore Semiconductor has successfully used a full suite of Tektronix test instrumentation to test and validate its recently announced USB 2.0 integrated circuit. The new PulseCore IC is the first in the industry to use spread spectrum clocking (SSC) to reduce electromagnetic interference while achieving USB 2.0 industry compliance.
Keithley Launches New Instrument Platform
Keithley Instruments has announced its Series 2600A System SourceMeter Instrument family. They provide unmatched ease-of-use, measurement performance, and flexibility in order to speed time-to-market for its users, lower cost of test, and simplify the process of making high performance measurements.
National Instruments Extends Environmental Monitoring Capabilities in LabVIEW
National Instruments has announced the release of a new instrument driver that gives users of the NI LabVIEW graphical system design platform the ability to interface with environmental monitoring sensors that communicate via SDI-12, a serial-based communication protocol optimised for battery-powered intelligent sensors. With NI LabVIEW SDI-12 Application Programming Interface (API)software, researchers, engineers and scientists can easily acquir...
WaveAce™ Series Digital Oscilloscopes with 60 MHz to 300 MHz Bandwidths
LeCroy Corporation introduces the WaveAce™ series of digital oscilloscopes that expands its line of portable, affordable and easy to use oscilloscopes in the 60 MHz to 300 MHz range. The WaveAce™ improves troubleshooting and shortens debug time by providing unique features such as long memory, a color display, extensive measurement capabilities, and advanced triggering. A streamlined, time-saving user interface provides quick access to all im...
Compact MID-compliant energy meter from Carlo Gavazzi
Carlo Gavazzi’s MID-certified and compliant family of energy meters has been enhanced by adding Dupline Fieldbus capability to the smallest and most powerful MID instrument that enables three-phase direct connection up to 65A and external CT connection up to 10A. This makes the EM24 the only such device on the market fully compatible with a complete and flexible Fieldbus system.
BAE Systems, National Instruments and Phase Matrix Introduce 26.5 GHz PXI Synthetic Instrument
BAE Systems, National Instruments and Phase Matrix Inc. have announced the availability of a next-generation, 26.5 GHz synthetic instrument based on the PXI platform for military and commercial RF and microwave applications. Synthetic instrumentation is a subset of virtual instrumentation that combines modular hardware with a software platform to create user-defined test and measurement systems. The new synthetic instrument developed by the compa...
TI driving forward new IEEE 1149.7 standard
As chips add new functionality and system designs evolve away from boards and toward multi-chip system-on-chip (SoC) architectures, developers of handheld and consumer electronics are faced with stricter pin and package constraints. Texas Instruments, a key member of the IEEE working group, announced that it is driving the ratification of the IEEE 1149.7 standard, a new two-pin test and debug interface standard that supports half the number of pi...
NI Announces PXI Embedded Controller and New PXI System Accessories
National Instruments has announced the NI PXI-8108, what it says is the industry’s fastest PXI embedded controller, and two new PXI system accessories, a 32 GB solid-state hard drive and the NI PXI-8250 system monitoring module. These new products provide increased system performance and reliability to help engineers and scientists achieve faster process execution, lower test times and longer system life.
Keithley Expands MIMO RF Measurement Capabilities with 8x8 MIMO Test System
Keithley Instruments is extending its lead in RF MIMO (multiple-input, multiple-output) test with what it says is the industry’s first measurement-grade 8x8 MIMO system. The system is used for primary research of next-generation RF MIMO devices and technologies.