Test & Measurement

A high-speed, high-accuracy real-time V/I curve tracer that is ideally suited to carrying out DC parametric testing on semiconductor and optoelectronic devices has been introduced by Yokogawa Europe. The new compact, lightweight unit consists of the Yokogawa GS820 multichannel source measure unit and the 765670 curve tracer software, which runs on a PC connected to the GS820 via a USB link.

National Instruments has announced the expansion of its C Series data acquisition family with the NI 9225 300 V power measurement module as well as the NI 9235 and NI 9236 eight-channel strain gage measurement modules. These modules are supported on NI C Series-based devices including the NI CompactDAQ plug-and-play data acquisition system, NI CompactRIO rugged control and acquisition system and NI Single-Board RIO embedded design devices. These ...

TESEQ has announced the introduction of its new NSG 3040 ESD test generator. The NSG 3040 is small, smart and has a high-contrast 7in touch-screen colour display and rotary control wheel to simplify programming with simple and intuitive operation. With its open modular architecture, the NSG 3040 is the ideal immunity test system for smaller engineering laboratories. The NSG 3040 offers outstanding capabilities to demanding EMC test companies and ...

National Instruments has announced Measurement Studio 8.6, which increases test and measurement functionality for Visual Studio 2008, the latest Microsoft development environment. Measurement Studio 8.6 features the industry’s first complete set of .NET and C++ class libraries, tools and data acquisition and instrument control driver support for Microsoft Visual Studio 2008, Microsoft Foundation Class Library (MFC) 9.0 and the .NET Framework 3....

Keithley Instruments has announced its ACS Basic Edition, characterization and curve tracer software for component test applications. The latest addition to Keithley's powerful Automated Characterization Suite (ACS) family, ACS Basic Edition integrates with the industry’s broadest range of source-measure units, Keithley's SourceMeter Instrument family. ACS Basic Edition, pared with Keithley’s proven line of SourceMeter instruments, replaces o...

Strategic Test Corp. has announced two new 500 kS/s 16-bit data acquisition cards for PCI Express. The UF2e-4731 has 16 analog inputs and the UF2e-4730 has 8 inputs. Unique features include the options for dual-timebase sampling, synchronous digital inputs, asynchronous digital I/O and the ability to synchronize hundreds of channels.

Keithley Instruments has announced that it is developing a WiMAX device production test solution for two 802.16e WiMAX devices from Fujitsu Microelectronics Limited. This WiMAX RF SISO/MIMO manufacturing test configuration features Keithley’s award-winning RF test solutions, the Model 2820 RF Vector Signal Analyzer and Model 2920 RF Vector Signal Generator. The configuration will enable Fujitsu Microelectronics to perform a set of Tx and Rx tes...

Tektronix has announced several new probe tips with signal bandwidths to 8 GHz including high temperature applications for the P7500 Series TriMode Differential Probe. The new tips are designed specifically for probing DDR2 and DDR3 memory DIMMs and are also useful for general purpose probing applications. The new accessories use socket cable technology for quick and easy attachment. The new TriMode tips provide improved usability and lower co...

National Instruments has announced LabWindows/CVI 9.0, the latest version of the proven ANSI C development environment for building reliable test and measurement solutions. It includes an improved compiler and debugger, which speed test development and throughput, and introduces new features for real-time systems to deliver application reliability.

Tektronix has announced that its UWB WiMedia compliance test solution has been selected by Testronic Laboratories, a leading test and certification center, to provide Wireless USB interoperability testing.