Test & Measurement

Keithley Instruments has published a white paper on how semiconductor characterization and parametric test solutions are evolving to keep pace with rapid changes in the semiconductor industry. The white paper, which can be downloaded at www.keithley.com/navigate, describes the emerging technology and business dynamics affecting the industry, including the growing need for vendor support.

Finder has launched a pair of digital weekly time switches providing a programming capability enabling switching according to local sunrise and sunset times, that are automatically calculated from user input of current date, time and either local longitude and latitude or nearest major city.

National Instruments has announced six new wireless and Ethernet data acquisition modules and two ingress protection enclosures for remote monitoring and control in harsh environments. The new modules combine high-voltage digital I/O and IEEE 802.11b/g (Wi-Fi) or Ethernet communication to remotely monitor and control actuators such as pumps, valves and relays. Engineers and scientists can use these and other NI Wi-Fi or Ethernet devices with the...

Keithley Instruments has introduced a variety of hardware, firmware, and software enhancements to its award-winning Model 4200-SCS Semiconductor Characterization System. The Keithley Test Environment Interactive (KTEI) V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system’s Capacitance-Voltage (C-V) measurement capability, and support for the company’s new nine-slot Model 4200-SCS instrument chas...

Keithley Instruments has introduced what it says is the test industry’s only cabling solutions capable of handling I-V, C-V, and pulsed I-V signals with a single set of cables (patent pending). The new cabling kits are based on a patent-pending design that speeds and simplifies the process of making DC Current‑Voltage (I‑V), Capacitance‑Voltage (C‑V), and pulsed I‑V testing connections from any modern semiconductor...

The Quad Series from Clare Instruments is said to be the first tester that can be used to HiPOT/flash test electrical products with in-built internal circuitry while they are connected to an isolated power supply. Typical products that incorporate internal circuits are microprocessor based domestic/industrial washing machines, cooking appliances, consumer audio/TV/IT products and construction machinery built to international standards such as IEC...

Agilent has announced a strategic partnership with ASTER Technologies to enable integration of ASTER's TestWay Coverage Analyst with Agilent's printed circuit board assembly test platforms, enabling seamless test coverage analysis across test platforms.

Agilent has announced it has expanded its Universal Serial Bus (USB) test portfolio with the industry's first automated calibration of a USB 3.0 pattern generator required for receiver test. This enhancement will significantly reduce test system setup time and is a major step toward fully automated receiver tests.

Aeroflex has announced an agreement with Icom Inc. to provide automated test and alignment capabilities for Icom radios on the Aeroflex 3920 Digital Radio Test Set. Initial test capabilities will be focused on the IC-F9010/F9510 APCO Project 25 Conventional and Trunked Radios and the IC-F4029SDR Series dPMR Portable Digital Radios. The test programs will be expanded to include Icom’s IDAS Series NXDN compatible radios and D-STAR digital amateur...

Keithley Instruments will broadcast a webcast seminar titled “Practical Tips and Tricks for Avoiding Common Pitfalls when Implementing Parallel Test” on Thursday, March 26, 2009. This one-hour seminar will offer guidance on migrating from sequential test to parallel test and explore ways to maximize resource utilization, balance system controller duties efficiently, and manage control of test timing and sequencing.