Test & Measurement
National Instruments - USB Device and Sensor Suite for Sound and Vibration Applications
National Instruments has announced a new portable bus-powered dynamic signal acquisition (DSA) module and a suite of vibration sensors that are ideal for making high-accuracy vibration measurements required for noise, vibration and harshness (NVH) and machine condition monitoring applications. The NI USB-4431 DSA module acquires data at rates from 1 to 102.4 kS/s, which makes it possible to obtain a wide measurement bandwidth. The combination of ...
Aeroflex and w2bi agree to develop new LTE handset certification platform
Aeroflex and w2bi have announced that they have entered into an agreement under which they will pool their test expertise and technology for the joint development of a network certification platform for LTE mobile devices.
Stanford Research function generator with 10% discount and FREE GPIB interface
Lambda Photometrics is currently offering the Stanford Research Systems DS345 30MHz function generator with a 10% discount and FREE GPIB interface. The versatile DS345 30 MHz function generator can generate sine, square, ramp, triangle and arbitrary waveforms with 1 microHz resolution.
GOEPEL to run free Boundary Scan Training Days in UK
GOEPEL electronics is offering a free JTAG/Boundary Scan Training Day at the premises of interested parties located in UK and Ireland. The respective seminar is addressing system architects, R&D engineers as well as test production engineers to find out how versatile and effective JTAG/Boundary Scan is for the test, programming and emulation of boards and whole systems.
Keithley Adds Free Graphing Toolkit to Series 3700 System Switch/Multimeter Firmware
Keithley Instruments has announced the addition of a Web-browser-based, multi-channel graphing toolkit capability to its Series 3700 System Switch/Multimeter family. This new data visualization capability, which is included at no charge in the firmware for all new Series 3700 mainframes, offers users a quick and easy way to observe measurement data vs. time as channel measurements are made with the optional built-in digital multimeter, without t...
Keithley at this weeks Femtocells World Summit 2009 in London
During the Femtocells World Summit 2009 in London, June 23 - 25, 2009, representatives from Keithley Instruments will be on hand to demonstrate the Keithley-ACE Solution manufacturing test solution for femtocells based on the picoChip PC202 Integrated Baseband Processor and the PC205 High Performance Integrated PHY Processor.
Boundary Scan Software Platform features Automatic Program Generator for functional Emulation Test of Bus Components
GOEPEL electronic has announced the introduction of a fully automatic program generator specifically for the dynamic test of on-board system bus structures in the context of the Boundary Scan software platform SYSTEM CASCON. The newly developed tools are based on the innovative VarioTAP technology for functional emulation tests and enable a complete automation of the test vector generation, as well as for the error diagnostics for the first time ...
Agilent Technologies' InfiniiSim Waveform Transformation Software Lets Engineers View Waveforms Anywhere in High-Speed Digital Systems
Agilent Technologies Inc. today announced waveform transformation software for its Infiniium 9000 and 90000 Series oscilloscopes. The software lets engineers view waveforms at any point in a high-speed serial data system, including PCI Express(r), USB 3.0, SATA and DisplayPort systems. It provides de-embedding, virtual probing and simulation tools for real-time analysis that help engineers characterize their systems more thoroughly and improve me...
Agilent Technologies Introduces Family of Miniature Passive Probes with Bandwidths from DC to 1.5 GHz for High-Speed Digital Applications
Agilent Technologies Inc. today introduced a family of miniature, passive oscilloscope probes and accessories with bandwidths from DC to 1.5 GHz. Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe-tip accessories make the Agilent N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today's high-speed digital applications.
High-speed 16-bit digitiser card has 125MHz bandwidth
The new Razor family of high-speed, high-performance digitiser cards has been released by GaGe Applied. The new multi-channel 16-bit digitisers feature up to four channels, 100 or 200 MS/s maximum sampling per channel, up to 2 GS of on-board memory, and 65 or 125 MHz bandwidth.