Test & Measurement

Agilent has announced the addition of 6.5 and 14 GHz options to its E5071C ENA network analyzer. These options expand the E5071C's frequency range beyond the existing 4.5, 8.5 and 20 GHz line-up, allowing users to select the most suitable frequency option for their specific application and significantly reducing the production line's cost of test. Both the 6.5 and 14 GHz options support 2- and 4-port configurations. Such flexibility is ideal for ...

Aeroflex has announced the TM500 TD-LTE Multi-UE, adding a multiple handset (multi-UE) capability to its market-leading test mobile range supporting TD-LTE infrastructure development. The TM500 TD-LTE Multi-UE enables TD-LTE infrastructure equipment vendors to test the performance of their TD-LTE basestations (e-NodeBs) under loaded conditions, accelerating the pace of infrastructure equipment development programmes. At the same time, Aeroflex h...

LXI compliant Ethernet options are now available for the Yokogawa DL9000 Series of digital and mixed-signal oscilloscopes and the SB5000 vehicle serial bus analyser. The new options, designated /C9 and /C12, meet the Class C requirements of the LXI Standard.

In response to changing industry demands, the Dynaload division of TDI Power has developed a new line of electronic loads. The Dynaload XBL Series features 800, 2000, 4000, and 6000 W models with a wide range of voltage inputs and sophisticated computer programming via GPIB, Ethernet, or RS232. These units also feature an integrated web page for local system operation and control.

CIL, the Andover-based electronics design manufacturing company, has increased its flying probe test capability by installing a new Takaya APT9401CE. The installation is part of the company’s continuous investment programme and is required to increase capacity for new business activities.

Amplicon’s new Test Systems Division has been developed to provide system integrators and end-users with the widest range of test system hardware at a price that only a manufacturer and tier 1 distributor can offer. PXI, Compact PCI (cPCI), LXI and PC-based systems along with an extensive product integration service provides customers with a finished hardware platform allowing them to concentrate on their specific area of expertise – typicall...

Keithley Instruments has created an application-specific microsite for those responsible for characterizing solar/photovoltaic devices. “Simplify Your Solar Cell Testing with Keithley’s Precision Measurement Solutions” describes Keithley’s high accuracy solutions for solar cell I-V and C-V characterization, which allow high speed testing without the hassles of integrating separate instruments or writing complicated programs. It also descr...

Agilent Technologies Inc. today announced the availability of a new, more powerful version of its popular NanoSuite software package. Designed for use with the company's line of nanoindentation and tensile-testing instruments, Agilent NanoSuite 5.0 software offers advanced features such as enhanced imaging capabilities, survey scanning and a new test method development environment. All NanoSuite 5.0 functions have been optimized to help researche...

Tektronix and National Instruments today announced that the two companies have extended their more than 20-year relationship by unveiling plans to co-innovate on new products that will improve productivity and lower costs for engineers and scientists working in design verification, manufacturing test, scientific research, and embedded test. The two companies will unveil specific details at NIWeek 2009 scheduled for Aug. 4–6 in Austin, Texas.

Verigy, the semiconductor test company, today introduced SmartRA (Scalable Memory Redundancy Technology), a memory redundancy analysis (RA) option for its V6000 WS test system. SmartRA provides a scalable, flexible, cost-effective solution that allows manufacturers to meet the expanding fail storage and performance requirements of redundancy analysis for DRAM.