Test & Measurement

National Instruments has announced its collaboration with Test System Strategies, Inc. (TSSI), inventor of the Waveform Generation Language (WGL), on a new software tool that is compatible with NI LabVIEW graphical system design software. This software tool makes it possible for semiconductor test engineers to import WGL and IEEE 1450 Standard Test Interface Language (STIL) simulation vectors into NI PXI digital test systems, a task which previou...

A new version of Yokogawa’s curve-tracer software for semiconductor testing has been introduced for the company’s GS610 source measure unit. Designed to carry out voltage/current analysis on two-lead or three-lead components including discrete semiconductors, integrated circuits and optoelectronic components, the new PC-based software works in conjunction with the USB-connected GS610 to enable source and sink operations at up to 100 V at 0.5 ...

Spirent Communications plc has been recognized as the market leader for Ethernet testing by Frost & Sullivan according to the World Gigabit Ethernet Test Equipment Market report. Spirent sold more Ethernet test ports than any other vendor through its comprehensive solution portfolio that spans testing from the lab to the live network and into the subscriber’s home.

National Instruments has announced X Series multifunction data acquisition (DAQ) devices for PCI Express and PXI Express. The 16 new X Series DAQ devices provide enhancements to analogue I/O, digital I/O, onboard counters and multidevice synchronisation. X Series devices integrate native PCI Express support for high-throughput data transfer, advanced timing and synchronisation technology for precise measurement and control and the ability to perf...

Some years ago Hitex published the first Insider's Guide as an Engineer's Introduction to the C166 Family. It was the beginning of a success story: Thousands of engineers all around the world could benefit from the useful information given in printed form or pdf format.

Anritsu Company introduces the MU150110A multi-rate/multi-channel unit for its MP1590B Network Performance Tester. The plug-in unit creates a single-instrument 10G transport test solution with the MP1590B mainframe and allows the tester to accurately evaluate the performance of SDH/SONET, OTN, and PDH/DSn equipment from 1.5M to 11.1G, as well as 10GbE interfaces during development and manufacturing.

Anritsu Company introduces the MT8855A, the world’s first integrated test set capable of measuring the new generation of products using the Bluetooth Advanced Audio Distribution Profile (A2DP), headset profile, and hands-free profile. Providing frequency coverage of 20 Hz to 20 kHz, the MT8855A offers lower cost-of-test, significantly reduced development time, and greater confidence in the quality of products shipped compared to alternative mul...

Agilent Technologies Inc. today introduced its new PCI Express(r) (PCIe) high-speed data acquisition card with on-board field programmable gate array (FPGA) for real-time data processing. This new platform provides higher sampling rates, faster measurement throughput and even more flexibility to OEMs and many test and measurement engineers, while maintaining precision and cost effectiveness.

Agilent Technologies Inc. today announced its compliance with the March 2009 release of the 3GPP Long Term Evolution (LTE) standard. Agilent's compliance enables broader test capability for LTE TDD, LTE FDD and MIMO.

Underwriters Laboratories announced today the expansion of its global photovoltaic testing services to Suzhou, China, where it will open a Photovoltaic Technology Center of Excellence. The new facility, set to open on February 26, 2009, will be the largest photovoltaic testing laboratory in Greater China and have the capability to test to both UL and International Electrotechnical Commission (IEC) Standards. This announcement marks yet another st...