Test & Measurement
TRaC, Agilent Technologies Announce Comprehensive Bluetooth-Qualification Test System
TRaC and Agilent Technologies Inc. today announced the availability of TRaC’s Bluetooth test system, which uses Agilent’s N4010A Wireless Connectivity Test Set. The Bluetooth test system, developed by TRaC engineers in conjunction with Agilent hardware engineering, delivers a fully automated RF qualification solution to the Bluetooth Specification Test Suite Structure and Test Purpose System Specification 1.2/2.0/2.0+EDR/2.1/2.1+EDR. Addition...
30MHz digital demodulation for Aeroflex 3280A Series Spectrum Analyzers added as standard feature
Aeroflex has announced the 3280A Series spectrum analyzers with 30MHz digital demodulator and generic vector demodulation as standard features with no price increase over its predecessor, the 3280 Series. Digital demodulation in the 3280A Series spectrum analyzers allows engineers to analyse the transmitter characteristics of wireless devices. The 3280A Series includes many optional measurement suites including WiMAX, WLAN, UMTS, CDMA2000, and GS...
Boundary Scan Platform supports Test of RS232 Interfaces
GOEPEL electronic has introduced 9305-BAC/RS232, another Bus Access Cables (BAC) as new member of the industry leading JTAG/Boundary Scan hardware platform SCANFLEX® In connection with the SCANFLEX multi port module SFX9305, new family member of Bus Access Cables enables the test of RS232 interfaces in combination with extended JTAG/Boundary Scan operations based on a unique platform.
Anritsu Extends Frequency Range of VectorStar 4-port Solutions to Measure Passive High-Speed Balanced Transmission Lines and Connections
Anritsu Company has announced it has extended the low-end frequency of its MN469xB VectorStar 4-port test sets, making the instruments the first microwave multiport Vector Network Analyzer (VNA) solutions to measure down to 70 kHz.
CellMetric launches 4G LTE eNodeB Test Signal Generator
Cambridge based digital cellular and broadcast company CellMetric announces the launch of a Long Term Evolution (LTE) eNodeB 4G base station test signal generator. CellMetric’s Modus 6 LTE test solution is compliant with Release 8 of the Third Generation Partnership Project standard (3GPP) and supports both Time Domain Duplex (TDD) and Frequency Domain Duplex (FDD) modes. This follows the 11th December 2008 functional freeze of LTE as part of 3...
China Mobile and Motorola Use Aeroflex TM500 Test Mobile for TD-LTE Demonstrations at Telecom World 2009
Aeroflex has announced that China Mobile Communications Company (CMCC) and Motorola will use Aeroflex’s highly successful TM500 LTE test mobile at International Telecommunications Union’s (ITU) Telecom World 2009 as part of China Mobile’s TD-LTE booth demonstrations.
National Instruments Announces More Than 8000 Drivers Available Through IDNet for Instrument Control
National Instruments has announced more than 8000 instrument drivers available through the NI Instrument Driver Network (IDNet) that make it easy to connect and control stand-alone instruments. IDNet is the industry’s largest source of instrument drivers and easy-to-use software optimised for instrument control, including NI LabVIEW, LabWindowsTM/CVI and Measurement Studio for Microsoft Visual Studio. This network, which includes more than 500 ...
Green Hills Probe Supports Intel Architecture
Green Hills Software Inc. has announced that it has added support for Intel architecture to the Green Hills Probe, the fastest and smartest debug probe ever built. The Green Hills Probe supports the latest Intel architecture, including the Intel Atom™, Intel Core2 Duo, and Intel Core i7. Together with the MULTI integrated development environment (IDE), the Green Hills Probe is a versatile tool for hardware bring-up, software and firmware debugg...
National Instruments - NI CompactDAQ Chassis for Higher-Performance USB Data Acquisition at a Lower Price
National Instruments has announced the NI cDAQ-9174 four-slot and cDAQ-9178 eight-slot NI CompactDAQ chassis, which are advanced versions of the popular NI CompactDAQ chassis released in 2006. The two new chassis build on the functionality of the original chassis by adding a four-slot option; the ability to take mixed-sensor measurements at different rates; two built-in, external BNC triggers; and four advanced counters. These, along with NI-DAQm...
Agilent Technologies - Probes for General-Purpose Differential Signal Measurements
Agilent Technologies has introduced 200-MHz and 800-MHz, high-voltage differential probes. The differential probes provide superior general-purpose differential signal measurements required for today's high-speed power measurements, vehicle bus measurements and digital system designs.