Test & Measurement
Anritsu and Bluetest to support MIMO OTA measurements
Anritsu and Bluetest have combined their recent product upgrades to create an Over-the-Air (OTA) measurement solution in a MIMO environment for verifying RF performance in the tri-frequency bands of the latest WLAN standard (IEEE 802.11be).
EEA shortlist: Dukosi
Dukosi’s Contactless Cell Monitoring System has been shortlisted for the Electronics Excellence Awards under the Test & Measurement Product category.
EEA shortlist: GRAS Sound & Vibration
GRAS Sound & Vibration’s new measurement microphones have been shortlisted for the Electronics Excellence Awards under the Test & Measurement Product category.
EEA shortlist: Keysight
Keysight’s InfiniiVision HD3 Series Oscilloscopes have been shortlisted for the Electronics Excellence Awards under the Test & Measurement Product category.
EEA shortlist: Pico Technology
Pico Technology’s PicoScope 3000E has been shortlisted for the Electronics Excellence Awards under the Test & Measurement Product category.
Efficient test coverage analysis with AI support
As part of the SYSTEM CASCON software platform from GÖPEL electronic, Test Coverage Analyzer (TCA) has been a powerful tool providing detailed information regarding test coverage and possible test gaps.
Farnell adds NI mioDAQ to T&M lineup
Farnell has added the new NI mioDAQ device to Emerson’s USB data acquisition (DAQ) product line. It is Emerson’s most powerful bus-powered USB DAQ device to date, designed to simplify setup and enhance performance for engineering teams.
HIL simulation and EV BMS test rig demo from Pickering
Pickering Interfaces will showcase its range of modular signal switching and sensor simulation solutions for electronics test and verification in automotive applications ranging from ECUs and body control modules to infotainment and ABS brake controllers – including HIL (hardware-in-the-loop) simulation and BMS (battery management system) test – on booth #14995 at Automotive Testing Expo North America 2024, taking place 22–24 Oc...
Efficient inspection of semiconductors and electronic components
With the ChipControl command set, EVT offers a compact, easy-to-use tool for the inspection of semiconductors and electronic components.
Rohde & Schwarz, Skylo achieve “significant milestone” for NB-NTN test
Rohde & Schwarz and Skylo Technologies have verified and validated all of the test cases defined in Skylo’s network operator acceptance criteria, including newly added test cases for SMS over NB-NTN, using the advanced CMW500 wideband radio communication tester.