Test & Measurement
NPL next-gen quantum comms measurement breakthrough
Scientists at the National Physical Laboratory (NPL) have developed a new technique to test and measure the performance of next-generation optical fibre interconnects for quantum communication networks.
Advantest launches Real-Time Data Infrastructure platform
Advantest has announced that its newly launched ACS Real-Time Data Infrastructure (RTDI) has been accepted by multiple major data analytics companies as part of an industry-wide collaboration to accelerate data analytics and artificial intelligence (AI)/machine learning (ML) decision-making within a single, integrated platform.
Hitachi High-Tech launches the GT2000
Hitachi High-Tech has announced the launch of its GT2000 high-precision electron beam metrology system.
$10m new connected technologies laboratory in Surrey
Element Materials Technology (Element), a global provider of Testing, Inspection, and Certification (TIC) services, has invested $10 million in a connected technologies laboratory near Guildford, England, to support advancements in consumer electronics.
Advantest adds test solutions for NAND, NV memories
Semiconductor test equipment supplier Advantest has added three products to its suite of memory test products.
eCall testing integrated into EMC environment
Applus Laboratories and Rohde & Schwarz have successfully showcased the seamless integration of eCall testing in an electromagnetic compatibility (EMC) test environment.
Vitrek test equipment driven by the CHIPS and Science Act
Vitrek is actively engaged in supporting the expansion of the US-based semiconductor manufacturing industry driven by the CHIPS and Science Act enacted into law in 2022.
Outdated battery measurement solutions can impact e-mobility vehicle performance
In recent years, low-power e-mobility vehicles have become extremely popular as sustainable and efficient modes of transportation.
Hitachi launches dark field wafer defect inspection system
Hitachi High-Tech has announced the launch of the Hitachi Dark Field Wafer Defect Inspection System DI4600 – a new tool for inspecting particles and defects on patterned wafer in semiconductor production lines.
Evaluating battery cell quality in electric vehicles
The automotive industry is undergoing a monumental shift towards electrification, with batteries at the forefront of this transformation. No component in the history of car technology has such a profound influence on the finished result while undergoing its own rapid speed of advancement.