Low noise MEMS accelerometers target condition monitoring
Two high frequency, low noise MEMS accelerometers designed specifically for industrial condition monitoring applications have been announced by Analog Devices. The ADXL1001 and ADXL1002 MEMS accelerometers deliver the high resolution vibration measurements necessary for early detection of bearing faults and other common causes of machine failure.
Historically, inadequate noise performance of available high frequency MEMS accelerometers compared with legacy technology held back adoption, failing to take advantage of MEMS reliability, quality and repeatability.
The noise performance of the ADXL1001 and ADXL1002 over high frequencies is on par with available PZT technology, and make ADI MEMS accelerometers an option for new condition monitoring products.
The devices provide high quality and accurate data for Smart Factory Internet of Things applications, and enable intelligent sensing from the edge of the network.
The accelerometers deliver ultra-low noise density over an extended bandwidth with high-g range.
They are available in two models with full-scale ranges of ±100g (ADXL1001) and ±50g (ADXL1002).
Typical noise density for the ADXL1002 is 25μg/√Hz, with a sensitivity of 40mV/g, and 30μg/√Hz for ADXL1001 with sensitivity 20mV/g.
Both accelerometers operate on single voltage supply from 3.0 to 5.25V, and offer useful features such as complete, electrostatic self-test and over range indicator.
The ADXL1001 and ADXL1002 are rated for operation over a -40 to 125°C temperature range.
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