Spring probes for solar panel testing

Spring probe technology is well suited to provide electrical connection to obtain I-V curve measurements, or providing reliable contact for your challenging high current or low voltage connections. SPP-25 probes feature low, stable resistance, a centre close for enhanced pointing accuracy, tip styles designed to distribute spring force across a large area, and two force options - 4oz and 6oz. The probes are specifically designed to yield a linear force compression relationship as the probe is actuated. This minimises potentially harmful jumps or steps in force. SPP-25 probes fit into standard Pogo 25 receptacles.

ECT probes are often used for standard or custom automated test equipment and fixture applications which involve simulation, production testing, characterisation, validation or failure analysis.

Tony DeRosa, Senior Product Manager, ECT explained: “Whether you are making contact directly with silicon/thin film circuitry, or the bus bar of your PV device, ECT offers a wide range of sizes, tip styles and spring forces to accommodate your specific application.”